Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Atomic force microscopy (AFM) has emerged as an indispensable tool for probing mechanical properties at the nanometre scale. By monitoring the deflection and vibration of a microfabricated cantilever ...

The Semilab AFM-1000 is a state-of-the-art tabletop atomic force microscope designed to deliver high-resolution, sub-atomic, precise measurements with an extremely low noise level. It enables highly ...

The Park FX40 Automatic Atomic Force Microscope (AFM) System is capable of high spatial resolution surface mapping and is equipped with a True Non-Contact TM mode capable of nanoscale surface analysis ...

Invented in 1986 atomic force microscopy (AFM) has become a valuable tool for life scientists, offering the ability to image aqueous biological samples, like membranes, at nanometer resolution. The ...

In a study recently published in the journal Nano Letters, researchers from Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Kanazawa, Japan, used frequency-modulated atomic force ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

Macrophages drive key immune processes including inflammation, tissue repair, and tumorigenesis via distinct polarization states whose accurate identification is vital for diagnosis and immunotherapy.

Park Systems, a leading global manufacturer of atomic force microscopy (AFM) and nanoscale metrology systems, today announced ...

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several ...