Berkeley — The more time it takes for an earthquake fault to heal, the faster the shake it will produce when it finally ruptures, according to a new study by engineers at the University of California, ...

Overview: We have developed an accurate fault modeling tool to capture variation-induced faults in Networks-on-Chip (NoCs). The core of our fault model has circuit-level accuracy, while its ...

With small-scale CMOS technology nodes, the probability of physical defects occurring in the device increases. Various defects occur which cannot be detected with the help of conventional Single Stuck ...

The IDDQ test relies on measuring the supply current (I DD) of an IC’s quiescent state, when the circuit isn’t switching and inputs are held at static values. Test patterns are used to place the ...

Solar arrays can often experience faults that go undetected for long periods of time, causing generation and revenue losses. In particular, residential-scale solar projects lack sensing and ...

This aerial image of the San Andreas Fault in the Carrizo Plain shows numerous curved drainages where fault slip has stretched stream channels to the left. Eventually, the channels get ‘reset’ when ...

The current shift in the test methodologies is away from the ubiquitous single stuck-at fault model. The best test for any device is to exhaustively test the device. The quality of such a test would ...

A new study reveals that the more time an earthquake fault has to heal, the faster the shake it will produce when it finally ruptures. Because the rapidity and strength of the shaking are what causes ...