Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...

Distributed Processing Solution Speeds ATPG Runtime When using 12 to 16 processors, TetraMAX TenX distributed processing can accelerate automatic test-pattern generation (ATPG) runtime by a factor of ...

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...