Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...
Breaking Taps on MSN
Measuring atomic flatness – the flattest material revealed
Some surfaces claim precision—but under an atomic force microscope, most don’t stand a chance. We scanned everything from ...
Learn how multi-scale insights from AFM and AFP enhance hybrid bond integrity and device performance.
Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...
An atomic force microscope tip writes data in stable ferroelectric structures, enabling reliable multistate storage at ...
Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...
New research shows how metastatic cancer cells prevent the immune system from eliminating them by changing their shape to ...
Kanazawa University, in collaboration with Osaka University and the National Institutes for Quantum Science and Technology, ...
The research introduces a 3D approach to visualize electrical properties in perovskite films, paving the way for enhanced ...
A new 3D electrical imaging method shows how passivation reduces defects in perovskite solar cells, clarifying charge transport and stability limits.
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