
Atomic force microscopy - Wikipedia
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a …
AFM, which uses a sharp tip to probe the surface features by raster scanning, can image the surface topography with extremely high magnifications, up to 1,000,000X, comparable or even better than …
9.2: Atomic Force Microscopy (AFM) - Chemistry LibreTexts
Aug 28, 2022 · Atomic force microscopy (AFM) has become a powerful tool to investigate 2D materials and the related 2D materials (e.g., graphene) for both the nano-scale imaging as well as the …
Atomic Force Microscopy - an overview | ScienceDirect Topics
Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution …
Atomic Force Microscopy - An Overview from Asylum Research
What is Atomic Force Microscopy (AFM)? Atomic Force Microscopy, or AFM, is a high resolution form of scanning probe microscopy that employs a sharp tip in a raster motion to measure and visualize …
A beginner's guide to atomic force microscopy probing for cell ...
Atomic Force microscopy (AFM) is becoming a prevalent tool in cell biology and biomedical studies, especially those focusing on the mechanical properties of cells and tissues.
Atomic force microscopy - Latest research and news | Nature
Dec 20, 2025 · Atomic force microscopy (AFM), a form of scanning probe microscopy, is a technique where a cantilever with a sharp tip is systematically scanned across a sample (biological or material)...
Atomic Force Microscope: Principle, Parts, Uses - Microbe Notes
Jun 5, 2023 · The atomic force microscope (AFM) is a type of scanning probe microscope whose primary roles include measuring properties such as magnetism, height, friction. The resolution is …
Atomic Force Microscopy - Nanoscience Instruments
The atomic force microscope (AFM) was developed to overcome a basic drawback with STM – it can only image conducting or semiconducting surfaces. The AFM has the advantage of imaging almost …
Atomic-force microscopy | NIST
Mar 26, 2021 · Atomic-force microscopy enables subnanometer imaging resolution, to extract geometric parameters of reference structures that advance measurement science, and to quantify the accuracy …